Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

Author(s)
Finan, William F
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MIT Japan Program.
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Description
Includes bibliographical references.
Date issued
1993
URI
http://hdl.handle.net/1721.1/17109
Publisher
MIT Japan Program, Massachusetts Institute of Technology
Other identifiers
93-01
Series/Report no.
MITJP (Series) ; 93-01.
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