Singapore-MIT Alliance (SMA): Recent submissions
Now showing items 88-90 of 554
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TEM Study on the Evolution of Ge Nanocrystals in Si Oxide Matrix as a Function of Ge Concentration and the Si Reduction Process
(2006-01)Growth and evolution of germanium (Ge) nanocrystals embedded into a silicon oxide (SiO₂) system have been studied based on the Ge content of co-sputtered Ge-SiO₂ films using transmission electron microscopy (TEM) and X-ray ... -
Native Point Defects in yttria as a High-Dielectric-Constant Gate Oxide Material: A First-Principles Study
(2006-01)Yttria (Y₂O₃) has become a promising gate oxide material to replace silicon dioxide in metal-oxide-semiconductor (MOS) devices. The characterization of native point defect in Y₂O₃ is essential to understand the behavior ... -
Monitoring Defect Formation in Colloidal Self Assembly using Photonic Bandgap Variations
(2006-01)Defect control in colloidal crystals is essential for these nanostructures to be effective as photonic bandgap (PBG) materials. We have used in-situ monitoring of the PBG of a colloidal crystal to study the structural ...
