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dc.contributor.authorRummler, W. D.en_US
dc.date.accessioned2010-04-24T05:17:43Z
dc.date.available2010-04-24T05:17:43Z
dc.date.issued1962-07-15en_US
dc.identifierRLE_QPR_066_IXen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53758
dc.descriptionContains reports on one research project.en_US
dc.description.sponsorshipLincoln Laboratory, Purchase Order DDL B-00337en_US
dc.description.sponsorshipU. S. Armyen_US
dc.description.sponsorshipU. S. Navyen_US
dc.description.sponsorshipU. S. Air Force under Air Force Contract AF 19(604)-7400en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1962en_US
dc.relation.ispartofNoise in Electron Devicesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 66en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherNoise in Electron Devicesen_US
dc.subject.otherOptimum Noise Performanceen_US
dc.titleNoise in Electron Devicesen_US
dc.typeTechnical Reporten_US


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