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Optical and Infrared Spectroscopy

dc.contributor.authorGeick, R.en_US
dc.contributor.authorPerry, C. H.en_US
dc.contributor.authorReifenstein, E. C., IIIen_US
dc.contributor.authorWactlar, H. D.en_US
dc.contributor.authorYoung, E. F.en_US
dc.contributor.authorHakel, W. J.en_US
dc.contributor.authorLubitz, P.en_US
dc.contributor.authorAthans, D. P.en_US
dc.contributor.authorHall, D. B.en_US
dc.date.accessioned2010-04-24T20:52:19Z
dc.date.available2010-04-24T20:52:19Z
dc.date.issued1965-01-15en_US
dc.identifierRLE_QPR_076_IVen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/54044
dc.descriptionContains research objectives and reports on one research project.en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1965en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofOptical and Infrared Spectroscopyen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 76en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherOptical and Infrared Spectroscopyen_US
dc.subject.otherTechniques of Far Infrared Interferometryen_US
dc.titleOptical and Infrared Spectroscopyen_US
dc.typeTechnical Reporten_US


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