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dc.contributor.authorKleppner, Danielen_US
dc.contributor.authorWalther, F. G.en_US
dc.contributor.authorPhillips, William D.en_US
dc.contributor.authorJacobsen, A.en_US
dc.contributor.authorChu, F. Y.en_US
dc.contributor.authorPritchard, David E.en_US
dc.contributor.authorMattison, E. M.en_US
dc.contributor.authorApt, Jerome, IIIen_US
dc.contributor.authorLacy, J.en_US
dc.contributor.authorBailey, R.en_US
dc.contributor.authorWieman, C. E.en_US
dc.date.accessioned2010-07-01T20:24:45Z
dc.date.available2010-07-01T20:24:45Z
dc.date.issued1972-01-15en_US
dc.identifierRLE_QPR_104_IIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56224
dc.descriptionContains research objectives, summary of research and reports on five research projects.en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DAAB07-71-C-0300en_US
dc.description.sponsorshipNational Science Foundation (Grant GP 28679)en_US
dc.description.sponsorshipNational Bureau of Standards (Grant 1-35857)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1972en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofAtomic Resonance and Scatteringen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 104en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherAtomic Resonance and Scatteringen_US
dc.subject.otherNuclear Mass Correction to the Bound Electron g-Factoren_US
dc.subject.otherMolecular-Beam Studies of van der Waals Moleculesen_US
dc.subject.otherCsHg Systemen_US
dc.subject.otherNew Apparatusen_US
dc.subject.otherSpin-Exchange Scatteringen_US
dc.subject.otherNonradiating Excited Complexesen_US
dc.titleAtomic Resonance and Scatteringen_US
dc.typeTechnical Reporten_US


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