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dc.contributor.authorCoppi, Brunoen_US
dc.contributor.authorGeorge, E. Victoren_US
dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorBers, Abrahamen_US
dc.contributor.authorBekefi, Georgeen_US
dc.contributor.authorMcCune, James E.en_US
dc.contributor.authorPolitzer, Peter A.en_US
dc.contributor.authorLidsky, Lawrence M.en_US
dc.contributor.authorParker, Ronald R.en_US
dc.contributor.authorSigmar, Dieter J.en_US
dc.contributor.authorDupree, Thomas H.en_US
dc.date.accessioned2010-07-14T22:26:24Z
dc.date.available2010-07-14T22:26:24Z
dc.date.issued1974-01-15en_US
dc.identifierRLE_QPR_112_XIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56441
dc.descriptionContains research objectives and summary of research.en_US
dc.description.sponsorshipU.S. Atomic Energy Commission (Contract AT(11-1)-3070)en_US
dc.description.sponsorshipNational Science Foundation (Grant GK-37979X)en_US
dc.description.sponsorshipNational Science Foundation (Grant GK-28282X1)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1974en_US
dc.relation.ispartofPlasma Dynamicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 112en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherPlasma Dynamicsen_US
dc.subject.otherConfinement Systemsen_US
dc.subject.otherLaser-Plasma Interactionsen_US
dc.subject.otherSymbolic Computation (MACSYMA) in Plasma Physicsen_US
dc.subject.otherIntense Relativistic Beam-Plasma Interactionsen_US
dc.subject.otherFusion Technology Studiesen_US
dc.subject.otherExperimental Studiesen_US
dc.subject.otherWavesen_US
dc.subject.otherTurbulenceen_US
dc.subject.otherRadiationen_US
dc.subject.otherGeneral Theoryen_US
dc.titlePlasma Dynamicsen_US
dc.typeTechnical Reporten_US


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