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dc.contributor.authorBirgeneau, Robert J.en_US
dc.contributor.authorWells, Barryen_US
dc.contributor.authorRamstad, Monte J.en_US
dc.contributor.authorYoung, Michael J.en_US
dc.contributor.authorHarring, Debra L.en_US
dc.date.accessioned2010-07-16T19:27:25Z
dc.date.available2010-07-16T19:27:25Z
dc.date.issued1993-01-01 to 1993-12-31en_US
dc.identifierRLE_PR_136_01_04s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57273
dc.descriptionContains an introduction, reports on three research projects and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-92-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.subject.otherVicinal Semiconductor Surfacesen_US
dc.subject.otherChiral Melting of the Si(113) (3x1) Reconstructionen_US
dc.subject.otherTwo-Dimensional Meltingen_US
dc.titleSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.typeTechnical Reporten_US


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