| dc.contributor.author | Birgeneau, Robert J. | en_US |
| dc.contributor.author | Greven, Martin | en_US |
| dc.contributor.author | Ramstad, Monte J. | en_US |
| dc.contributor.author | Michael J. Young, Michael J. | en_US |
| dc.contributor.author | Martin, Debra L. | en_US |
| dc.date.accessioned | 2010-07-17T01:06:27Z | |
| dc.date.available | 2010-07-17T01:06:27Z | |
| dc.date.issued | 1996-01-01 to 1996-12-31 | en_US |
| dc.identifier | RLE_PR_139_01_04s_01 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57360 | |
| dc.description | Contains table of contents for Section 4, an introduction and a report on one research project. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program Contract DAAL03-92-C-0001 | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1996 | en_US |
| dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
| dc.relation.ispartof | Surfaces and Interfaces | en_US |
| dc.relation.ispartof | Synchrotron X-Ray Studies of Surface Disordering | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 139 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Synchrotron X-Ray Studies of Surface Disordering | en_US |
| dc.subject.other | Stability of Vicinal Si(111) Surfaces Under Sublimation | en_US |
| dc.subject.other | Stability of Vicinal Si(111) Surfaces Under Electromigration | en_US |
| dc.title | Synchrotron X-Ray Studies of Surface Disordering | en_US |
| dc.type | Technical Report | en_US |
