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dc.contributor.authorBirgeneau, Robert J.en_US
dc.contributor.authorGreven, Martinen_US
dc.contributor.authorRamstad, Monte J.en_US
dc.contributor.authorMichael J. Young, Michael J.en_US
dc.contributor.authorMartin, Debra L.en_US
dc.date.accessioned2010-07-17T01:06:27Z
dc.date.available2010-07-17T01:06:27Z
dc.date.issued1996-01-01 to 1996-12-31en_US
dc.identifierRLE_PR_139_01_04s_01en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57360
dc.descriptionContains table of contents for Section 4, an introduction and a report on one research project.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAL03-92-C-0001en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1996en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 139en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.subject.otherStability of Vicinal Si(111) Surfaces Under Sublimationen_US
dc.subject.otherStability of Vicinal Si(111) Surfaces Under Electromigrationen_US
dc.titleSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.typeTechnical Reporten_US


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