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dc.contributor.authorWyatt, John L. Jr.
dc.contributor.authorCoram, Geoffrey J.
dc.date.accessioned2005-01-13T20:15:00Z
dc.date.available2005-01-13T20:15:00Z
dc.date.issued1997-10
dc.identifier.urihttp://hdl.handle.net/1721.1/7514
dc.descriptionAll correspondence concerning this article should be addressed to Prof. John Wyatten
dc.description.abstractThis paper proposes three tests to determine whether a given nonlinear device noise model is in agreement with accepted thermodynamic principles. These tests are applied to several models. One conclusion is that every Gaussian noise model for any nonlinear device predicts thermodynamically impossible circuit behavior: these models should be abandoned. But the nonlinear shot-noise model predicts thermodynamically acceptable behavior under a constraint derived here. Further, this constraint specifies the current noise amplitude at each operating point from knowledge of the device v - i curve alone. For the Gaussian and shot-noise models, this paper shows how the thermodynamic requirements can be reduced to concise mathematical tests involving no approximatioen
dc.description.sponsorshipSupported by the National Science Foundation Contract No. 94-23221.en
dc.format.extent484084 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen
dc.relation.ispartofseriesTechnical Report Massachusetts Institute of Technology, Research Laboratory of Electronics);616
dc.titleNonlinear Device Noise Models:Thermodynamic Requirementsen
dc.typeTechnical Reporten


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