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dc.contributor.authorKuraj, Ivan
dc.contributor.authorFeser, John
dc.contributor.authorPolikarpova, Nadia
dc.contributor.authorSolar-Lezama, Armando
dc.date.accessioned2026-01-30T22:31:21Z
dc.date.available2026-01-30T22:31:21Z
dc.date.issued2025-04-09
dc.identifier.issn2475-1421
dc.identifier.urihttps://hdl.handle.net/1721.1/164690
dc.description.abstractWe present batch-based consistency, a new approach for consistency optimization that allows programmers to specialize consistency with application-level integrity properties. We implement the approach with a two-step process: we statically infer optimal consistency requirements for executions of bounded sets of operations, and then, use the inferred requirements to parameterize a new distributed protocol to relax operation reordering at run time when it is safe to do so. Our approach supports standard notions of consistency. We implement batch-based consistency in Peepco, demonstrate its expressiveness for partial data replication, and examine Peepco’s run-time performance impact in different settings.en_US
dc.publisherACMen_US
dc.relation.isversionofhttps://doi.org/10.1145/3720513en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceAssociation for Computing Machineryen_US
dc.titlePeepco: Batch-Based Consistency Optimizationen_US
dc.typeArticleen_US
dc.identifier.citationIvan Kuraj, John Feser, Nadia Polikarpova, and Armando Solar-Lezama. 2025. Peepco: Batch-Based Consistency Optimization. Proc. ACM Program. Lang. 9, OOPSLA1, Article 119 (April 2025), 29 pages.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.relation.journalProceedings of the ACM on Programming Languagesen_US
dc.identifier.mitlicensePUBLISHER_POLICY
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2025-08-01T08:49:08Z
dc.language.rfc3066en
dc.rights.holderThe author(s)
dspace.date.submission2025-08-01T08:49:08Z
mit.journal.volume9en_US
mit.journal.issueOOPSLA1en_US
mit.licensePUBLISHER_CC
mit.metadata.statusAuthority Work and Publication Information Neededen_US


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